Specifying Analytical Model Types

You can model parametric and statistical variation in circuit behavior in Star Hspice by using:

Yield analyses are used to modify DC operating points, DC sweeps, AC sweeps, and transient analysis. They can generate scatter plots for operating point analysis and family of curves plots for DC, AC, and transient analysis.

The .MEASURE statement in Star-Hspice is used with yield analyses, allowing you to see distributions of delay times, power, or any other characteristic described with a .MEASURE statement. Often, this is more useful than viewing a family of curves generated by a Monte Carlo analysis. When the .MEASURE statement is used, a table of results is generated as an .mt# file, which is in readable ASCII format, and can be displayed in AvanWaves. Also, when .MEASURE statements are used in a Monte Carlo or data driven analysis, the Star-Hspice output file includes calculations for standard statistical descriptors:

Mean
Variance
Sigma
Average Deviation

Star-Hspice Manual - Release 2001.2 - June 2001